000 00436nam a22001697a 4500
008 120118t xxu||||| |||| 00| 0 eng d
020 _a9810223528
080 _a62
100 _aLau, W. S.
_91035
245 _aInfrared Characterization for Microelectronics
_cW. S. Lau
250 _as.ed.
260 _aSingapure
_bW.S.
_c1999
300 _a160p.
_b
_e
650 _aMicroelectronics
_91036
942 _2udc
_cBK
300 _c
_f
_g
999 _c24378
_d24378